I am trying to compare two MEMS accelerometers in terms of their noise for ground motion monitoring applications. I would like to take some "clean" data (recorded by good quality instrumentation), add white noise to it so I can bring it to the noise level of the MEMS sensors I'm testing, and then run some tests on these new signals with a heightened noise level.
I was wondering how to estimate the baseline noise level for the two MEMS.
One idea I had was to record data with the two MEMS in a controlled environment with little to no external disturbances, compute the histogram of the recording, and then model some white noise based on the histogram mean and variance.
I was wondering if instead I could use the datasheet noise spectral density information to do something similar?