This question is bordering on physics, but it is the signal side that I am interested in so I hope this is the correct forum.
I am very familiar with instrumental noise sources in CCD based spectrographs and what their signal properties are. I have come to realise how important understanding noise sources are in order to effectively mitigate for them.
Now I am taking an interest in FTIR which uses an interferometer to do the measurement and would like to understand how measurement errors manifest in the interferogram and how they manifest after the FT.
My suspicion is that the variations due to the technical act of measurement will share some aspects with CCD instruments but also present some sources that are very different. For example, spectrograph-CCD systems are affected by e.g. pixel-to-pixel shot noise, fixed pattern response, read out noise, spectra of optics (blank signal), dark signal, vibrations, alignment etc.
How do the following present in both the interferogram and the FT?
- random noise (i'm guessing its very different to shot noise in CCDs, not only pixel-to-pixel)
- vibrations (physical or thermal)
- mechanical whiplash
As I am not familiar with the technological errors associated with an interferometer I'm sure I've not anticipated some sources, so please educate me on any other sources of variation due to the technology (not the sample or sample-technology interface)
I've tried some searches but not found any useful resources so any good resources would be appreciated