Free alternatives to SIFT/SURF for commercial use
There are same very good algorithms for interest point detection/description, like:
- SIFT (Scale-Invariant Feature Transform)
- SURF (Speeded-Up Robust Features)
- MOPs (Multi-Scale Oriented Patches)
Regrettably, at least the first two are patented and cannot be used commercially without paying huge fees to the authors. I am currently negotiating about the third one, which is patented as well.
In a search for patent-free algorithm, I found there is a multitude of patents like this one. Huh?! Is there merely anything usable then?
Maybe at least Harris-Laplace or some basic detector can be used. But how to be sure?