Say I perform FFT on some data. If mythe underlying (measurement) sampling rate is not twice the highest frequency, I will almost assuredly get aliasing.
This limit on sampling we call the Nyquist limit. Now on the flip side, if my integrationthe integration underlying measurment window is not greater than the wavelength of the lowest frequency component, it is not guaranteed that I will be able to get a good readout of the lowest frequency component. Are there technical names to describe low frequency masking and the sampling limit imposed here?
Edit: I'm interested in terms descriptive of underlying measurment limits as opposed to transformation.